TA3 - Design of Metamaterials for Beam Guiding and Focusing in Electro Optic (EO) Detectors – Metalens Design and Characterization


  1. Eleftheriades, G.
  2. He, Y.
  3. Kim, M.
Corporate Authors
Defence Research and Development Canada, Valcartier Research Centre, Quebec QC (CAN);TORONTO UNIV, TORONTO ONT (CAN) DEPT OF ELECTRICAL AND COMPUTER ENGINEERING
In this report, we use full-wave electromagnetic simulations to characterize the 25 um x 25 um nanohole lens. Two types of simulations are performed: A Gaussian beam simulation and a plane wave simulation. In the Gaussian beam simulation, the incident Gaussian beam impinges at the top surface of the nano-hole lens, and the resulting beam spot size at the active region can be obtained. From this type of simulation, we can find out whether the lens produces an appropriate beam spot such that the incident energy is well contained inside the active region. In addition, the Gaussian beam incident locations are varied to examine the energy concentration in the active region under different incident conditions. The second type of simulation is a plane-wave simulation. The purpose of this simulation is to provide a reference for the experimental characterization results. The plane-wave simulation emulates the setup in the actual experimental setup, where a planewave strikes the back surface of a 500 um thick InP substrate. The 25 um x 25 um lens is patterned on the front surface of the substrate and collimates the incident plane wave. The focal spot will be generated and imaged by a CCD camera. The plane-wave simulation is used to obtain the focal length and focal spot of the lens and compare them to the experimental results. The detailed simulation setup and results for the two types of simulation will be presented in the following sections. In addition, based on these simulations,

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Report Number
DRDC-RDDC-2018-C234 — Contract Report
Date of publication
01 Dec 2018
Number of Pages
Electronic Document(PDF)

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