CHARACTERIZATION AND CALIBRATION OF A PULSED LASER SYSTEM FOR SINGLE EVENT UPSET SIMULATION

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Authors
  1. Pepper, G.T.
  2. Fechete, A.
Corporate Authors
Defence Research Establishment Ottawa, Ottawa ONT (CAN)
Abstract
A pulsed Nd: Glass laser facility that was developed at Defence Research Establishment Ottawa, for the simulation of single event upsets (SEUs) in electronics, is described in detail. The performance of the laser system, the associated instrumentation and data acquisition systems were extensively characterized during the process of studying the charge collected in a silicon p-i-n photodiode, due to laser and ion-induced SEU. Laser simulation of SEUs is demonstrated to be an accurate and convenient complementary method to ion accelerator-based SEU experimentation.
Keywords
SINGLE EVENT UPSET (SEU);PULSED LASER SYSTEM
Report Number
DREO-1241 —
Date of publication
01 Nov 1994
Number of Pages
44
DSTKIM No
95-02977
CANDIS No
149000
Format(s):
Document Image stored on Optical Disk;Hardcopy

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