DIFFRACTION EFFECTS ENCOUNTERED IN THE MEASUREMENT OF BIDIRECTIONAL REFLECTANCE FROM SQUARE PYRAMIDS

Authors
  1. Christie, F.E.
  2. DeVriendt, A.B.
Corporate Authors
American Inst of Aeronautics and Astronautics, New York NY (US);Defence Research Establishment Valcartier, Valcartier QUE (CAN)
MONITOR AGENCY
Laval Univ, Quebec QUE (CAN)
Abstract
Theoretically and photographically determined bidirectional reflectance data are presented for a set of sixteen regularly rough surfaces composed of square pyramids which were illuminated by a He-Ne laser beam. The included angles of the ruled V-grooves were 60, 90, 120 and 150 degrees, while the peak-to-valley depths were 2.5, 5, 10 and 20 microns. The photographs graphically illustrate a smooth transition from reflectance patterns predicted by diffraction theory to others described by conventional bidirectional reflectance theory. Although precise measurement is difficult in some diffuse patterns, agreement between the theoretical and photographic data was generally 1o or less.
Report Number
AIAA-PAPER-73-150 — Reprint 3794, Paper presented at AIAA 11th Aerospace Sciences Meeting, Washington, January 10-12, 1973
Date of publication
01 Jan 1973
Number of Pages
9
DSTKIM No
73-06208
CANDIS No
20652
Format(s):
Hardcopy

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