BEAM SPLITTER LAYER EMISSION IN FOURIER-TRANSFORM INFRARED INTERFEROMETERS

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Authors
  1. Theriault, J-M.
Corporate Authors
Defence Research Establishment Valcartier, Valcartier QUE (CAN)
Abstract
The self-emission from the splitting layer of a Fourier-transform infrared interferometer is modeled with basic properties of optical thin films. The resulting equation gives explicitly the self-emission contribution in terms of the temperature, the complex refractive index, the reflection coefficient, and the thickness of the beam splitter layer.
Keywords
Beam splitter;Fourier transform infrared interferometer (FTIR);Parasite radiation
Date of publication
20 Dec 1998
Number of Pages
5
Reprinted from
Applied Optics, vol 37, no 36, 1998, p 8348-8351
DSTKIM No
99-00364
CANDIS No
510257
Format(s):
Hardcopy;Document Image stored on Optical Disk

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