Mössbauer Effect and X-ray Diffraction Studies of Fe1-xGax Films Prepared by Combinatorial Methods

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Authors
  1. Deschamps, N.C.
  2. Dunlap, R.A.
Corporate Authors
Defence R&D Canada - Atlantic, Dartmouth NS (CAN);Dalhousie Univ, Halifax NS (CAN) Dept of Physics
Abstract
This research was conducted by Norman Deschamps and Richard Dunlap of Dalhousie University (Department of Physics and Atmospheric Science) to evaluate the combinatorial synthesis and characterization approach for the development of Fe-Ga alloys. Binary combinatorial thin films of Fe100-xGax with a range of 0 < x < 36 at. % Ga were made using a sputtering approach. The films were analyzed using microprobe, XRD and Mössbauer spectroscopy, all of which were designed to allow for rapid measurements of the combinatorial systems. Microprobe data confirmed that a linear change in gallium composition was achieved along the length of each film. XRD analysis showed a disordered bcc structure for the film, for all compositions, and exhibited no evidence for occurrence of the D03 phase at increased Ga content. Lattice parameters for the thin films increased with increasing gallium, showing the same trend as seen in the literature, but with decreased lattice parameters. Mössbauer spectroscopy confirmed the lack of a D03 phase, and showed a steady increase of two or more gallium atom nearest neighbours for each Fe site past x = 22. Future work will include measurement of the magnetostrictive and physical properties of the combinatorial thin films.

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Report Number
DRDC-ATLANTIC-CR-2005-171 — Contractor Report
Date of publication
01 Nov 2005
Number of Pages
54
DSTKIM No
CA027853
CANDIS No
525721
Format(s):
CD ROM

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