Développement de méthodologies d’extraction de propriétés optiques – Ultra-violet, visible et proche infrarouge


  1. Gagné, G.
  2. Tremblay, G.
Corporate Authors
Defence Research and Development Canada, Valcartier Research Centre, Quebec QC (CAN)
In the framework of contract W7701-135517/001/QCL, task 6, AEREX Avionics Inc. had to review the methods used at DRDC Valcartier to measure the optical constants of various solid and liquid materials in the spectral bands 2 nm to 25 nm, adapt them to the bands 210 nm to 2 nm, and compare measurement results to a spectral library.Originally, this task was to be performed with the ellipsometer SOPRA GESP5 available at DRDC Valcartier. As it turned out, this machine was defective at the beginning of the task. We thus turned our efforts toward the Fourier transform spectrometer Vertex 80v from Bruker. Preliminary measurements made in the far infrared between 300 cm-1 and 6000 cm-1 being promising, wide band wire grid polarizers covering the 250 nm to 4 m spectral range were procured as well as a new A513 module capable of controlling them in the Vertex 80v system. Even though the Vertex 80v FTS from Bruker has numerous characteristics required for ellipsometric measurements, various problems kept us from performing adequate measurements. First of all, the light source is partially polarized creating imbalance in measurement polarization management. Also, the A513 module is made of 8 aluminum mirrors. All signatures we tried to measure were contaminated by the aluminum signature. The reference measurement, made also with an aluminum mirror, could not remove this signature. None of the potential reference mirrors surveyed can be used to eliminate the module signature at inc

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optical constants;spectrometer;polarization
Report Number
DRDC-RDDC-2016-C113 — Contract Report
Date of publication
01 Mar 2016
Number of Pages
Electronic Document(PDF)

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